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Responsibilities:
- Participate in definition of both chip level and block level design-for-test structure and methodology
- Responsible for ATPG and model creation, memory Built in Self Test, Embedded Deterministic Test and Boundary Scan Test
- Work closely with design engineer for design optimization for test coverage improvement, test volume and test time reduction
- Responsible for scan pattern simulation based on timing files and gate-level netlist, assist backend engineer with scan chain insertion and timing analysis
- Work closely with Product Engineer to debug and solve scan pattern failures on tester
- Work as a global team to do complex SOC design and test
Requirements:
- Bachelors or Master Degree or University Degree or equivalent from Electronic, Electrical or Computer Science.
- Well communication and Inter-person skill.
- Good language skill in English, Pass CET-6.
- Have knowledge about EDA tool as well as VLSI design flow.
- Good knowledge in Verilog, VHDL and script language.
- Have used Unix/Linux system and EDA tool from Cadence, Synopsis, Mentor digital and/or analog developing
- Basic knowledge of MBIST, Scan is a plus
- RTL and Gate level simulation experience is a plus.